The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field’s direction.
Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder.
The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.Technical parameters
Scope of delivery
✔ ICS 105 – 4-Axis Positioning System
✔ CS-Scanner – ChipScan-Scanner Software (USB)
✔ GND 25 – Ground Plane
✔ UH DUT Set – Universal Holder for Langer Scanner
✔ DM-CAM – Digital Microscope Camera
✔ SH 01 – Probe Holder for Langer Scanner
✔ ICS Flight Case – Protective Case for ICS
✔ ICS 105 M – ICS 105 User Manual
Technical parameters
Supply voltage110 / 230 V
Interface USB
Max. traverse range(50 x 50 x 50) mm; α-Rotation ±180°
Min. step size(10 x 10 x 10) µm; α-Rotation 1°
Positioning speed (10 x 10 x 5) mm/s; α-Rotation 90°/s
Weight 23 kg
Sizes (L x W x H)(350 x 400 x 420) mm
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